ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,374, issued on June 23, was assigned to The Board of Trustees of the University of Illinois (Urbana, Ill.). "Systems and methods for precis... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,375, issued on June 23, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Sample observation device and sample observation meth... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,376, issued on June 23, was assigned to UNIVERSITY OF NORTH TEXAS (Denton, Texas). "Laser energy assisted breakdown spectroscopy (LEABS) co... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,377, issued on June 23, was assigned to Siemens Healthcare Diagnostics Inc. (Tarrytown, N.Y.). "Reagent strip counterfeit protection" was i... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,378, issued on June 23, was assigned to NIRRIN TECHNOLOGIES INC. (Billerica, Mass.). "3-D printed probes for bioprocesses" was invented by ... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,379, issued on June 23, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Optical detection device, detection ... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,380, issued on June 23, was assigned to LG Energy Solution Ltd. (Seoul, South Korea). "Marking system and marking method for identifying de... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,381, issued on June 23, was assigned to TIAMA (St. Genis-Laval, France). "Optical computing methods and systems for inspecting a glass cont... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,382, issued on June 23, was assigned to Akzo Nobel Coatings International B.V. (Amsterdam). "Estimating biofilm biomass on objects in an aq... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,383, issued on June 23, was assigned to SUMCO Corp. (Tokyo). "Method of evaluating silicon single-crystal ingot, method of evaluating silic... और पढ़ें